Scanning Electron Microscope (SEM)


The SEM is used to acquire high resolution digital images and to analyze mineral compositions. It is equipped with secondary electron, backscatter and x-ray detectors. Students and faculty in the department use it to analyze metamorphic, igneous and sedimentary rocks as well as unconsolidated sediments from Lake Champlain. The facility is also used by students and faculty from the Biology Department, from the University of Vermont.

Purchased in 1994 with funds from the National Science Foundation and the Keck Foundation. Zeiss 940A with Oxford Instruments EDS attachment.